Improving the Gate-Induced Drain Leakage and On-State Current of Fin-Like Thin Film Transistors with a Wide Drain
Hsin-Hui Hu, Yan-Wei Zeng, Kun-Ming Chen
Applied Sciences · 2018
doi:10.3390/app8081406 (opens in a new tab)
We email you when a new notice or a question about this paper appears.
Reads
Read by people on this page
None yet.
Checked or read by AI through naulon
None yet.
A person counts once a day per paper. We keep no cookie and no address: a reader is a hash that changes every day. Any month under five reads shows no number.
Are you an author?
Is this your paper?
Claim it to add your note and be paid when agents cite it. Free.