Caracterização numérica do efeito do diodo PIN em superfícies seletivas em frequência reconfiguráveis utilizando o Método Iterativo das Ondas

<p>Numerical characterization is an important design step, since it minimizes the construction of prototypes and optimizes results. The choice of the technique to be used is an aspect of fundamental importance. In this context, this paper presents an analysis of the numerical characterization of reconfigurable frequency selective surfaces, RFSS, using the PIN diode as an active element, from the application of the Wave Concept Iterative Procedure, WCIP, is presented in this paper. The PIN diode is numerically replaced by a resistor, which corresponds to a load region, and it is possible to observe how the frequency response of the RFSS is altered by the variation of this equivalent resistance, including its transition region. The dimensions of the load region equivalent to the PIN diode and the resistance value variation are evaluated, which corresponds to different DC bias levels of the PIN diode. The results obtained are compared to the ideal cases of the short circuit and the open circuit, observing a good agreement for the value of the resonant frequency. Moreover, it has been verified that the proposed technique describes the behavior of the RFSS including in the transition region of the PIN diode, which is a very interesting result, indicating the applicability of the presented methodology.</p>

Abstract licence: CC BY-NC-SA

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