Development of a Novel Light Source for the Investigation of Optical Sensors
RP Jenner, SM Vaezi-Nejad
Measurement + Control · 1999
doi:10.1177/002029409903200301 (opens in a new tab)
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Abstract
This paper is concerned with the development of a novel light source which aids the study of the optoelectronic properties of amorphous semiconductors as optical sensors for process tomography. The light source is an integral part of a prototype industrial process tomographic system which is being developed for the detection and imaging of multiphase flows. In this paper, the design, assembly and performance of the light source are discussed in detail. Findings of the research into the suitability of amorphous semiconductors for industrial process tomography will be presented at a later stage in a subsequent paper.
Abstract licence: CC BY
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