Skip to content
naulon
Not checkedNot checked for notices yet.

Al 2 O 3 -Dielectric InAlN/AlN/GaN <inline-formula> <tex-math notation="LaTeX">${\Gamma}$ </tex-math></inline-formula>-Gate MOS-HFETs With Composite Al 2 O 3 /TiO 2 Passivation Oxides

Ching-Sung Lee, Xue-Cheng Yao, Yi-Ping Huang and 1 more

IEEE Journal of the Electron Devices Society · 2018

doi:10.1109/jeds.2018.2870844 (opens in a new tab)

We email you when a new notice or a question about this paper appears.

Reads

Read by people on this page

None yet.

Checked or read by AI through naulon

None yet.

A person counts once a day per paper. We keep no cookie and no address: a reader is a hash that changes every day. Any month under five reads shows no number.

Are you an author?

Is this your paper?

Claim it to add your note and be paid when agents cite it. Free.