Generalized Multiple Dependent State Sampling Plans in Presence of Measurement Data
Ritwik Bhattacharya, Muhammad Aslam
IEEE Access · 2020
doi:10.1109/access.2020.3021504 (opens in a new tab)
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Abstract
This article introduces a generalized version of the multiple dependent state sampling plan based on the measurement data, that is, when the quality characteristic is measured in a numerical scale. The conditions of application and the operating procedures of the proposed plan are discussed sequentially. A few important performance measures, such as operating characteristic curve, average total inspection and average sample number, are developed. The advantage of the proposed plan over the multiple dependent state sampling and single sampling plan is demonstrated through numerical example. Finally, one real-life data set is analyzed to illustrate the application of the proposed sampling plan.
Abstract licence: CC BY-NC-ND
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