High-resolution accelerator alignment using x-ray optics
Bingxin Yang, Horst Friedsam
Physical Review Special Topics. Accelerators and Beams · 2006
doi:10.1103/physrevstab.9.030701 (opens in a new tab)
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Abstract
We propose a novel alignment technique utilizing the x-ray beam of an undulator in conjunction with pinholes and position-sensitive detectors for positioning components of the accelerator, undulator, and beam line in an x-ray free-electron laser. Two retractable pinholes at each end of the undulator define a stable and reproducible x-ray beam axis (XBA). Targets are precisely positioned on the XBA using a pinhole camera technique. Position-sensitive detectors responding to both x-ray and electron beams enable direct transfer of the position setting from the XBA to the electron beam. This system has the potential to deliver superior alignment accuracy (1–3 μm) for target pinholes in the transverse directions over a long distance (200 m or longer). It can be used to define the beam axis of the electron-beam–based alignment, enabling high reproducibility of the latter. This x-ray–based concept should complement the electron-beam–based alignment and the existing survey methods to raise the alignment accuracy of long accelerators to an unprecedented level. Further improvement of the transverse accuracy using x-ray zone plates will be discussed. We also propose a concurrent measurement scheme during accelerator operation to allow real-time feedback for transverse position correction.
Abstract licence: CC BY
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