Correlation between ferroelectricity and ferroelectric orthorhombic phase of HfxZr1−xO2 thin films using synchrotron x-ray analysis
Takashi Onaya, Toshihide Nabatame, Yong Chan Jung and 9 more
APL Materials · 2021
doi:10.1063/5.0035848 (opens in a new tab)
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