A device for measuring electron beam characteristics
M. Andreev, S. Kovalsky, S. Kornilov and 2 more
AIP Advances · 2017
doi:10.1063/1.4974499 (opens in a new tab)
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Abstract
This paper presents a device intended for diagnostics of electron beams and the results obtained with this device. The device comprises a rotating double probe operating in conjunction with an automated probe signal collection and processing system. This provides for measuring and estimating the electron beam characteristics such as radius, current density, power density, convergence angle, and brightness.
Abstract licence: CC BY
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