Skip to content
naulon

Not checked for notices yet.

Description and validation of a circular padding method for linear roughness measurements of short data lengths

Stijn Schoeters, Wim Dewulf, Jean-Pierre Kruth and 2 more

MethodsX · 2020

doi:10.1016/j.mex.2020.101122

References 5

  1. 1.

    This reference’s wording can’t be shown under the paper’s licence.

    Not in our library

  2. 2.

    This reference’s wording can’t be shown under the paper’s licence.

    Not in our library

  3. 3.

    This reference’s wording can’t be shown under the paper’s licence.

    Not in our library

  4. 4.

    This reference’s wording can’t be shown under the paper’s licence.

    Not in our library

  5. 5.

    This reference’s wording can’t be shown under the paper’s licence.

    Not in our library

Reads

Read by people on this page

None yet.

Checked or read by AI through naulon

None yet.

A person counts once a day per paper. We keep no cookie and no address: a reader is a hash that changes every day. Any month under five reads shows no number.

Are you an author?

Is this your paper?

Claim it to add your note and be paid when agents cite it. Free.