TEM and SEM study of nano SiO2 particles exposed to influence of neutron flux
Elchin Huseynov, Adil Garibov, Ravan Mehdiyeva
Journal of Materials Research and Technology · 2016
doi:10.1016/j.jmrt.2015.11.001 (opens in a new tab)
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Abstract
Before and after neutron irradiation, in order to identify the “adhesion” in silica nanoparticles, analyses have been conducted on transmission electron microscope (TEM) at small nano dimensions. Simultaneously, at relatively larger nano dimensions, the surfaces of the samples were observed by the scanning electron microscope (SEM). Moreover, analyses of the samples with SAED (selected area electron diffraction) technology on TEM device used for determining the structure of the nanomaterial. From TEM analyses, it has been found that little “adhesion” is observed at small dimensions (maximum 70 nm) under the influence of neutron irradiation and this “adhesion” directly influences the electrophysical properties of nanomaterials.
Abstract licence: CC BY-NC
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