In situ and operando force‐based atomic force microscopy for probing local functionality in energy storage materials
Qiang Gao, Wan‐Yu Tsai, Nina Balke
Electrochemical Science Advances · 2022
doi:10.1002/elsa.202100038 (opens in a new tab)
We email you when a new notice or a question about this paper appears.
Abstract
Electrochemical energy storage is the key enabling component of electric vehicles and solar‐/wind‐based energy technologies. The enhancement of energy stored requires the detailed understanding of charge storage mechanisms and local electrochemical and electromechanical phenomena over a variety of length scales from atoms to full cells. Classical electrochemical techniques, such as voltammetry, represent the macroscopic electrochemical properties, and consequently do not allow to extract important information about local electrochemical reactions, ions adsorption, intercalations, and transport. Understanding, controlling, and tuning the local electrochemical functionalities in functional energy materials require in situ/operando techniques which limit the use of structural and functional characterization techniques that provide local information. Here, force‐based atomic force microscopies (AFMs) have provided novel insights into locally probing electrochemical mechanisms on tens of nanometer and even molecular length scales and provide a viable pathway to probe electrochemical processes in situ/operando. In this review, we highlight the contributions in the development and application of force‐based AFM methods to elucidate the local charge storage mechanism in a variety of energy‐related materials. We will focus in particular on methods or AFM modalities in a liquid electrolyte environment.
Abstract licence: CC BY-NC
Reads
Read by people on this page
None yet.
Checked or read by AI through naulon
None yet.
A person counts once a day per paper. We keep no cookie and no address: a reader is a hash that changes every day. Any month under five reads shows no number.
Are you an author?
Is this your paper?
Claim it to add your note and be paid when agents cite it. Free.