Measurements of RF Cavity Voltages by X-ray Spectrum Measurements
J. P. Duke, A. P. Letchford, D. J. S. Findlay
eConf C000821 (2000) MOc08 · 2000
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Abstract
Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
Abstract licence: CC0
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