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Electron diffraction analysis of individual single-walled carbon nanotubes

Jannik C. Meyer, Matthieu Paillet, Georg S. Duesberg and 1 more

Ultramicroscopy vol. 106 no. 3, pp. 176-190 (2006) · 2005

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Abstract

We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.

Abstract licence: CC0

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