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Temperature dependence of the resistance of a phase-slip line in a thin superconducting film

E. V. Il'ichev, V. I. Kuznetsov, V. A. Tulin

Phys. Solid State 35(11), 1460 (1993). [Fiz. Tverd. Tela (St. Petersburg) 35, 2972 (1993)] · 2004

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Abstract

An experimental investigation was made of the temperature dependence of the first step of a phase-slip line in a thin superconducting tin film. The depth of penetration of a nonequilibrium longitudinal electric field into the superconductor was determined near the critical temperature. A comparison was made with theoretical investigations of one-dimensional structures containing phase-slip centers. The experimental results were found to be in good agreement with the theory when the mechanism of mixing of electron-like and hole-like branches of the quasiparticle spectrum was governed by the elastic scattering of the excitations. This was one more experimental confirmation that a phase-slip line is a two-dimensional analog of a phase-slip center.

Abstract licence: CC0

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